Digital Portable DAC, AVG Curves Ultrasonic Flaw Detector / UT Flaw Detector FD350 USM60 USM35
Digital Portable Ultrasonic Flaw Detector, ultrasonic testing equopment, UT flaw detector, ultrasonic detector FD350
0.5 to 10,000 mm (steel) range selectable in fixed steps or continuously variable
1,000 to 15,000 m/s,continuously variable in steps of 1 m/s and 22 selectable material velocities
From -5 to 1,000μs
Measurement and setting of sound velocity and probe delay using two known calibration echoes (2-point calibration)
(Spike mode)
Low energy (70V)
High energy(500V)
Pulse Voltage 20 to 500 V adjustable in 10 V increments
Pulse Width Tunable from 20 to 1000 ns in 10 ns increments
Low(50 ohms),:High(500 ohms),(1,000 ohms in TR mode)
Pulse repetition frequency:20 to 1K Hz
Frequency ranges (-3 dB):0.2 to 1 MHz,0.5 to 4 MHz,2 to 20 MHz
Gain: 0 to 110 dB adjustable in selectable steps 0.5, 1.0, 2.0, 6.0, 12.0, user definable, and locked (step 0).
Full-wave, negative half-wave, positive half-wave and RF mode
Linear, 0 to 90 % screen height Variable in steps of 1 %
2 independent gates in color bar mode, start and width variable over the entire calibration range, response threshold of 5 to 95 % screen height variable in steps of 1 %,
Alarm signal via LED and connectable internal horn. Alarm mode of positive logic, negative logic or DAC
Expands A-scan display area for increased screen resolution.
Expands area within the selected gate over the entire display range for increased A-scan resolution.
Digital display of sound path (projection distance, depth) between initial pulse and the first echo in the gate, or between the echoes in the two gates, with selectable echo peak, echo flank or Japanese echo flank detection.
Amplitude display
In % screen height,
dB difference above gate height,
dB difference above DAC or TCG
dB difference above DGS curve (SDU 35X S) or ERS
Sound path, (reduced) projection distance, depth, amplitude for every gate, user configurable at four positions of measurement line and of the zoomed display in the A-scan
5.7 inch LED backlight TFT_LCD
Display resolution 320 x 240 pixels
A-scan resolution 200 x 220 pixels, 320 x 220 pixels (zoom)
Manual or automatic A-scan freeze,
A-scan comparison, echo dynamics
(envelope), peak echo storage
Minimum 900 datasets store instrument setups or reports including operation parameters plus A-scan, the stored datasets can be easily previewed, recalled and exported to a computer for edit and printing. Memory can be expanded up to 1900 datasets.
DAC (Distance Amplitude Curves) or TCG (Time Corrected Gain) with a maximum of 16 reference echoes, 4 other curves can be displayed with variable dB intervals. The dB difference between the echo and the recorded DAC curve is measured through gate A.
JIS DAC (Distance Amplitude Curves) with a maximum of 16 reference echoes, 4 other curves can be displayed with variable dB intervals, and 2 other curves can be displayed with constant dB intervals. The dB difference between the echo and the selected DAC curve is measured through gate A. The flaw class is evaluated according to JIS Z3060-2002
Provides a dynamic reflector indication rating for various AWS weld inspection applications. This allows more efficient inspections by eliminating manual calculations.
DGS curves for single-element and dual-element probes and for all materials, sound attenuation and transfer loss correction, 4 other curves can be displayed with variable dB intervals. Backwall, side drilled hole, flat bottom hole type of the reference reflector are used. Equivalent reflector size, dB difference or height difference is evaluated simultaneously.
mm, inch
RS232, bi-directional
An USB adaptor cable can be provided to connect the SDU 35X to a computer that does not have RS 232 port
2 x LEMO 01 big lemo
Chinese, German, English, French, Italian, Portuguese, Spanish, Danish, Swedish, Norwegian, Finnish, Czech, Slovenian, Romanian, Dutch, Croatian, Hungarian, Russian, Polish, Slovakian, Japanese, Serb
Li-ion battery pack (6.6 Ah)
12 hours with Li-ion battery pack
Power pack charger operation
Via an external power supply (100 to 240 VAC);
9 VDC
2 kg, including batteries
177 mm x 255 mm x 51 mm (H x W x D)
Product Info:
· Automated calibration Automated gain
· Automated make video of test process and play
· AWS D1.1, DAC/TCG, JIS DAC/TCG, AVG, DGS, A scan & B scan
· High-speed capture and very low noise
· Solid metal housing (IP65)
· High contrast viewing of the waveform from bright
· Powerful pc software and reports can be export to excel
· Small size, light weigh model
DAC DGS TGS
B Scan B Scan Thickness LEG ECHO
LEG GRID REF RF
Main Technical Index:
FUNCTIONS |
PARAMETERS |
Frequency |
0.2 – 20 MHz |
Detection range |
0 - 10000 mm |
Sound velocity |
100 – 20000 m/s |
Working methods |
Pulse echo, dual, and thru-transmission |
Pulse Shift |
-5 to 3400 μs in steel (dependent on range) |
Zero point of the probe |
0 – 100 μs |
Gain adjustment |
(0-110) dB, Step:0.2, 0.5, 1.0, 2.0, 6.0, 12.0, user definable(0-24), and locked |
Vertical linear error |
≤3% |
Horizontal linear error |
≤0.1% |
Dynamic range |
≥40dB |
Sensitivity surplus |
≥60dB (200mmdepth , Ф2 flat- bottomed hole ) |
Communications |
Connect with computer through RS232 or USB |
The average electric yawp |
≤20% |
Color TFT LCD |
5.25”x 3.875” (133 x 98 mm), 640 x 480 pixels VGA, color |
Gate alarm |
Wave-entering gate / wave-losing gate sound alarm, width, height, location, continuous-tuning |
Time of battery working |
7 hours |
Temperature of working |
-10°C-60°C |
Power |
220VAC, 110VDC |
Appearance size |
11.9”W x 9.9” H x 2” D (302 x 251 x 51 mm) |
Net weight |
5.5 lbs. (2.5 kg) Li-Ion Battery; 4.8 lbs. (2.2 kg) without battery |
Standard Delivery of Digital Portable Ultrasonic Flaw Detector FD350:
Portable ultrasonic flaw detector main unit
Operating manual
Straight Beam probe
Angle-beam probe(60 degree)
Probe cable
PC software CD
Serial PC cable
AC adapter/charger
Carrying case
Additional Accessories:
Straight probe (5MHZ-ф20)
Straight probe (2.5MHZ-ф20)
Straight probe (2.25MHZ-ф20)
Straight probe (1MHZ-ф20)
Angle probe (4MHZ-45degree, 8*9mm)
Angle probe (4MHZ-60degree, 8*9mm)
Angle probe (4MHZ-70degree, 8*9mm)
Angle probe (4MHZ-80degree, 8*9mm)
Angle probe (2MHZ-45degree, 8*9mm)
Angle probe (2MHZ-60degree, 8*9mm)
Angle probe (2MHZ-70degree, 8*9mm)
Angle probe (2MHZ-80degree, 8*9mm)
Probe T/R (5MHz-ф20mm, focus 15mm)
Probe T/R (2.5MHz-ф20mm, focus 15mm)
Connection cable to probe (BNC-BNC)
Connection cable to probe (BNC-Lemo 00)
Connection cable to probe (Lemo 01-BNC)
Connection cable to probe (Lemo 01-Lemo 00)
Lithium ion battery
Power adapter (4A/9V)
Power Cable
Leather case
Test block V1
Test block V2
Test blocks DAC, ASME etc.